Electronic components meeting quality specifications established by the Automotive Electronics Council (AEC) are suitable for automotive use without additional component-level qualification testing. Most commonly referenced AEC documents include:
- AEC-Q100 - Failure Mechanism Based Stress Test Qualification For Integrated Circuits
- AEC-Q101 - Failure Mechanism Based Stress Test Qualification For Discrete Semiconductors
Power Integrations offers a wide range of AEC-Q100 or AEC-Q101 qualified devices:
LinkSwitch-TN2Q High Voltage Offline Switcher ICs
LinkSwitch™-TN2 family of ICs provides significant reduction in component count compared to traditional discrete solutions. Designs using the integrated devices are highly reliable without the use of opto isolators.
|LNK3206GQ||AEC-Q100||60-550 V||750 V||360 mA||HVAC|
Qspeed™ diodes have the lowest QRR of any Silicon diode. Their recovery characteristics increase efficiency, reduce EMI and eliminate snubbers. These features help designers improve the performance of their power conversion circuits.
|AEC-Q101||200 V||10 A|
SCALE-iDriver Gate Driver ICs
The SCALE-iDriver™ Family of gate driver ICs, optimized for driving IGBTs, traditional MOSFETs and SiC MOSFETs bring PI’s FluxLink™ magneto-inductive bi-directional communications technology to 1200 V driver applications.
|600-1200 V||75 kHz||EV power train|
Drivers & inverters
|150kHz||EV BEV traction|